2026-10-15T07:33:47Z https://api.figshare.com/v2/oai

oai:figshare.com:article/34513104 2026-10-14T17:27:21Z category_915 category_12 category_21 category_272 category_873 category_734 portal_5 item_type_3 month_year_10_2026

<p>Sputtering yields, vacancies and Poisson errors for four doped W targets at different ion counts and dopant content.</p> Yanli Zhang (309699) Fei Zheng (193006) Jiangping Feng (18508653) Zhongsheng Cao (24062582) Qingyun Meng (1904524) Physical Sciences not elsewhere classified Cell Biology Biotechnology Environmental Sciences not elsewhere classified Chemical Sciences not elsewhere classified Biological Sciences not elsewhere classified sputtering yield make significant range variation offer reference insights monte carlo method longitudinal analysis along large sampling fluctuations evaluating doping performance approximately linear reduction various dopant species ti dopant showing primary radiation damage homogeneously doped phases w effectively reduces w &# 8211 doped w offers deuterium ions within based targets induced radiation damage deuterium ions dopant contents homogeneously tic based targets pure w xlink "> unreliable indicator tic possesses surface region strongest suppression srim simulation scale modeling results show irradiation tolerance energy localization displacement collisions compositional design ballistic distribution <p>Sputtering yields, vacancies and Poisson errors for four doped W targets at different ion counts and dopant content.</p> 2026-10-14T17:26:51Z Dataset Dataset 10.1371/journal.pone.0360154.t002 https://figshare.com/articles/dataset/_p_Sputtering_yields_vacancies_and_Poisson_errors_for_four_doped_W_targets_at_different_ion_counts_and_dopant_content_p_/34513104 CC BY 4.0