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In-situ Electrochemical Spectroscopic
Ellipsometry Characterization of Polymer and MXene Films
Hui Fang (177012)
Manushree Tanwar (5368673)
Hannah S. Nedzbala (4354396)
Anupma Thakur (3910696)
Sophia LaPorta (25151502)
Howe Chen (25151505)
Colton J. Sheehan (18858828)
Babak Anasori (1367853)
James M. Mayer (1262151)
Zahra Fakhraai (1275690)
Space Science
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providing practical guidelines
outline key steps
interfacial studies relevant
help prevent overfitting
electrochemical spectroscopic ellipsometry
avoid modeling artifacts
mxene films due
3 </ sub
2 </ sub
accurate data analysis
situ </ italic
situ </
mxene films
x </
help guide
data analysis
electrochemical reactions
thin films
various types
time monitoring
sub ><
simultaneous change
similar conditions
refractive index
optical properties
informed selection
energy conversion
enable real
electrochromic effect
dry conditions
dielectric data
cyclic voltammetry
broadly adopted
broad range
accurate results
></ sub
<i>In-situ</i> electrochemical spectroscopic
ellipsometry
(EC-SE) can enable real-time monitoring of optical properties and
thickness changes of surfaces and thin films. This method can provide
a broad range of information on the evolution of the microenvironment
of an electrode during electrochemical reactions. However, to avoid
modeling artifacts, accurate data analysis is critical. Here, we outline
key steps in data analysis that can help prevent overfitting and misinterpretation
of results. For example, determining the refractive index of the electrolyte
at the air/electrolyte interface, along with measurements of the electrode’s
dielectric data in dry conditions, can yield more accurate results
than simultaneous fitting of all parameters for the electrolyte and
electrode. We also present detailed modeling strategies tailored to
fitting <i>in-situ</i> cyclic voltammetry (CV) data on various
types of thin films, by providing two distinct examples: the thickness
change of catalyst polymer films due to swelling by the electrolyte,
and the simultaneous change in thickness and optical properties of
Ti<sub>3</sub>C<sub>2</sub>T<sub><i>x</i></sub> MXene films
due to both reversible (electrochromic effect) and irreversible (degradation)
processes. These details can help guide the informed selection of
models in similar conditions by providing practical guidelines. The
step-by-step approach to modeling can be more broadly adopted to enhance
the accuracy and reproducibility of EC-SE experiments for interfacial
studies relevant to energy conversion and storage, as well as other
electrochemical reactions.
2026-10-01T00:00:00Z
Text
Journal contribution
10.1021/acs.chemmater.6c00768.s001
https://figshare.com/articles/journal_contribution/In-situ_Electrochemical_Spectroscopic_Ellipsometry_Characterization_of_Polymer_and_MXene_Films/34038009
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