2026-10-11T06:14:04Z https://api.figshare.com/v2/oai

oai:figshare.com:article/33781660 2026-09-29T12:02:57Z category_36833 portal_1075 item_type_1 month_year_09_2026

Additional Material for Reviewer Yi Zhao (14034) Muyang Huang (21328619) Fang Lyu (7377464) Hongkun Yang (8070962) Xiaolong Sun (1726846) Yong Liu (6908) Yue Hou (2562085) Ziyu Wang (451367) Rui Xiong (1434895) Physical sciences Thermoelectric Thin films Ion implantation This Supplementary Material provides detailed information on the fabrication, ion implantation, and post-annealing treatment of Ni-implanted Sb₂Te₃ thin films. It also presents complementary structural, chemical, morphological, and theoretical analyses, including XRD, XPS, SEM/EDS mapping, and relaxation calculations, together with additional thermoelectric measurements as functions of film thickness and implantation voltage. These results support the discussion of ion-implantation-induced resonant states and their role in enhancing the thermoelectric response of Sb₂Te₃ thin films. 2026-09-29T12:02:57Z Image Figure 10.60893/figshare.apl.33781660.v1 https://figshare.com/articles/figure/Additional_Material_for_Reviewer/33781660 CC BY 4.0