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        <datestamp>2026-10-01T12:06:53Z</datestamp>
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          <dc:title>SUPPORTING INFORMATION Thermal-boundary-condition control of electrothermal scaling in V₄O₇ thin films across the metal-insulator transition</dc:title>
          <dc:creator>Fernando Camino (1305612)</dc:creator>
          <dc:creator>Yarimar Rivera-Robles (24301559)</dc:creator>
          <dc:creator>Andy Gutierrez (14637010)</dc:creator>
          <dc:creator>Mingzhao Liu (1640293)</dc:creator>
          <dc:creator>Armando Rua (19563157)</dc:creator>
          <dc:subject>Physical sciences</dc:subject>
          <dc:subject>V₄O₇ thin films;</dc:subject>
          <dc:subject>metal-insulator transition;</dc:subject>
          <dc:subject>electrothermal transport; Joule heating</dc:subject>
          <dc:description>Supplementary material includes full-range I-V characteristics of the V₄O₇/Al₂O₃ device demonstrating Ohmic behavior, a detailed description of the procedure used to extract the temperature rise ΔT from nonlinear transport, and analysis of the robustness of the extracted ΔT(P) against current-sweep history.</dc:description>
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