<?xml version='1.0' encoding='utf-8'?>
<?xml-stylesheet type="text/xsl" href="/v2/static/oai2.xsl"?>
<OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd">
  <responseDate>2026-10-06T08:56:11Z</responseDate>
  <request identifier="oai:figshare.com:article/33465886" metadataPrefix="oai_dc" verb="GetRecord">https://api.figshare.com/v2/oai</request>
  <GetRecord>
    <record>
      <header>
        <identifier>oai:figshare.com:article/33465886</identifier>
        <datestamp>2026-09-29T12:08:47Z</datestamp>
        <setSpec>category_32963</setSpec>
        <setSpec>portal_1075</setSpec>
        <setSpec>item_type_6</setSpec>
        <setSpec>month_year_09_2026</setSpec>
      </header>
      <metadata>
        <oai_dc:dc xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance"  xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
          <dc:title>Supplementary Material</dc:title>
          <dc:creator>Yanan Li (94033)</dc:creator>
          <dc:creator>Leila Ghorbani (21143384)</dc:creator>
          <dc:creator>Philippe Bezard (13117571)</dc:creator>
          <dc:creator>Shreya Kundu (13117565)</dc:creator>
          <dc:creator>Yuchao Jiang (3964508)</dc:creator>
          <dc:creator>Xiaoyu Piao (23816701)</dc:creator>
          <dc:creator>Cassie Sheng (24724243)</dc:creator>
          <dc:creator>Katia Devriendt (3052395)</dc:creator>
          <dc:subject>Engineering</dc:subject>
          <dc:subject>Iridium etching</dc:subject>
          <dc:subject>Plasma etching</dc:subject>
          <dc:subject>Halogen plasma chemistry</dc:subject>
          <dc:subject>Plasma-surface interaction</dc:subject>
          <dc:description>Supplementary material including pressure-dependence measurements, ion beam etching comparison experiments, TEM/EDS analysis under Cl₂-based plasma conditions, and XPS surface atomic concentrations.</dc:description>
          <dc:date>2026-09-29T12:08:47Z</dc:date>
          <dc:type>Text</dc:type>
          <dc:type>Journal contribution</dc:type>
          <dc:identifier>10.60893/figshare.jva.33465886.v1</dc:identifier>
          <dc:relation>https://figshare.com/articles/journal_contribution/Supplementary_Material/33465886</dc:relation>
          <dc:rights>CC BY 4.0</dc:rights>
        </oai_dc:dc>
      </metadata>
    </record>
  </GetRecord>
</OAI-PMH>
