This research is focused on studying the failure mechanisms in low-temperature-aged cells using high-speed x-ray computed tomography and thermal imaging in tandem. Cells are induced into failure via heating and are rotating rapidly for tomographic acquisition.

Supplementary Videos 1, 3, 5, 7, 9, 11, 13, and 15 present thermal imaging footage of the failure testing for Cells 1–8, respectively. These videos show a thermal view from within the chamber of the rotating experimental setup, capturing the lead-up to thermal runaway, the runaway event, and the subsequent cool-down period.

Supplementary Videos 2, 4, 6, 8, 10, 12, 14, and 16 present high-speed X-ray computed tomography (CT) data, capturing the cell behaviour before, during, and after the thermal runaway event.