Data description:
Figure 2c: Ga and Al composition (%) along line scans A and B through the charge carrier funnel.
Figure 2d: Data (height) for the atomic force microscopy (AFM) image (topography) for a typical energy-landscape modified quantum dot (ELM-QD).
Figure 2e: Topography and the corresponding bandgap energy profile along two AFM line scans. The bandgap energy was calculated using the thickness of the funnel AlGaAs layer and the Al composition.
Figures 3a and 3b: Spatial maps of photoluminescence (PL) spectra for representative ELM-QDs. Micro-PL spectra were measured using an optical excitation beam of ~1 micron in diameter translated across the surface of the ELM-QDs.
Figure 3a: Inset: Micro-PL spectrum at the position of the ELM-QD in Fig. 3a.
Figure 3c: Remote optical excitation of ELM-QDs: normalised PL intensity as a function of the distance from the point of excitation for ELM-QDs and ordinary QDs (o-QDs).
Figure 4a: PL spectrum data for the ELM-QD in Fig. 3a of the Article (ELM-QD 1) for an excitation power of 100 nW.
Figure 4b: Pump power dependence of the peak PL intensity for a typical ELM-QD (blue) compared to a typical o-QD (red).
Figure 4c: Second-order correlation function, g(2), for photon emission from ELM-QD 1, collected after spectrally filtering the PL emission.
Figure 4c inset: PL spectrum data for ELM-QD1 after spectral filtering.
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