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        <identifier>oai:figshare.com:article/27186993</identifier>
        <datestamp>2024-10-08T13:25:00Z</datestamp>
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          <identifier identifierType="DOI">10.5522/04/27186993.v1</identifier>
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            <creator>
              <creatorName>Lombardo, Antonio</creatorName>
              <givenName>Antonio</givenName>
              <familyName>Lombardo</familyName>
            </creator>
            <creator>
              <creatorName>Xhameni, Aferdita</creatorName>
              <givenName>Aferdita</givenName>
              <familyName>Xhameni</familyName>
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          <titles>
            <title><![CDATA[Dataset for the article "Forming and Compliance-free Operation of Low-energy, Fast-switching HfO<sub>x</sub>S<sub>y</sub>/HfS<sub>2</sub> Memristors"]]></title>
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          <subjects>
            <subject>Nanoelectronics</subject>
            <subject>Nanomaterials</subject>
            <subject>Resistive switching</subject>
            <subject>Memristors</subject>
            <subject>2D Materials</subject>
            <subject>Oxidation</subject>
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            <date dateType="Created">2024-10-08</date>
            <date dateType="Updated">2024-10-08</date>
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          <publicationYear>2024</publicationYear>
          <publisher>University College London</publisher>
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            <description descriptionType="Abstract"><![CDATA[<p dir="ltr">Dataset for the manuscript "Forming and Compliance-free Operation of Low-energy, Fast-switching HfO<sub>x</sub>S<sub>y</sub>/HfS<sub>2</sub> Memristors" by Aferdita Xhameni et al. </p><p dir="ltr">The dataset is split in two folders containing the data shown in the main manuscript and in the supplementary information respectively. Within each folder, data are organized in sub-folders corresponding to the figures in the article. </p><p dir="ltr">The dataset includes: </p><ol><li>All the raw electrical data (pulsed switching, switching cycles, retention, etc.) of the experimental resistive memories shown in the paper. The data have been acquired via a Keysight B1500 parameter analyzer equipped with remote sensing units (waveform generator/ fast measurement unit) and a Keysight P9243a oscilloscope.</li><li>Simulated current-voltage (I-V) characteristics of HfO<sub>x</sub> and HfO<sub>x</sub>/HfS<sub>2</sub> memristors generated by using Synopsys Sentaurus TCAD. <br></li></ol><p></p>]]></description>
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